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Dr. Daniel Haufe on “Take a look at the wafer” – application of optical metrology at Infineon –

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Date/Time
Date(s) - 10/04/2018
7:00 pm - 8:30 pm

Location
HängeMathe

Categories Keine Kategorien


Research meets industry! We give a warm welcome to our former colleague Dr. Haufe who will hold a speech “Take a look at the wafer” – application of optical metrology at Infineon – within our lecture series (Tue, 10th April, 7p.m., Club HängeMathe e.V.). We are looking forward to get insights into optical metrology at Infineon 🙂

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